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KO50001004-00190074-0039  
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Title
Title Diffusion of phosphorus in silicon  
Kana  
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Kana  
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Creator
Name 安西, 修一郎  
Kana アンザイ, シュウイチロウ  
Romanization Anzai, Shūichirō  
Affiliation lnstructor, Faculty of Engineering, Keio University  
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Name 松本, 三郎  
Kana マツモト, サブロウ  
Romanization Matsumoto, Saburō  
Affiliation Late Student, Present address Showa Electrochemical lndustry Ltd.  
Affiliation (Translated)  
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Name 下重, 長正  
Kana シモシゲ, チョウセイ  
Romanization Shimoshige, Chōsei  
Affiliation Late Student, Present address Sumitomo Metal lndustries Ltd.  
Affiliation (Translated)  
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Name 柳沢, 三郎  
Kana ヤナギサワ, サブロウ  
Romanization Yanagisawa, Saburō  
Affiliation Professor, Faculty of Engineering, Keio University  
Affiliation (Translated)  
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Edition
 
Place
東京  
Publisher
Name 慶応義塾大学藤原記念工学部  
Kana ケイオウ ギジュク ダイガク フジワラ キネン コウガクブ  
Romanization Keio gijuku daigaku Fujiwara kinen kogakubu  
Date
Issued (from:yyyy) 1966  
Issued (to:yyyy)  
Created (yyyy-mm-dd)  
Updated (yyyy-mm-dd)  
Captured (yyyy-mm-dd)  
Physical description
 
Source Title
Name Proceedings of the Fujihara Memorial Faculty of Engineering Keio University  
Name (Translated) 慶応義塾大学藤原記念工学部研究報告  
Volume 19  
Issue 74  
Year 1966  
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Start page 149(39)  
End page 155(45)  
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Abstract
The diffusivity of phosphorus into (111) plane of silicon has been measured by means of radioactivated elemental phosphorus and electro-polishing method. The diffusion coefficient has been determined as D=0.12×exp (-2.9eV/kT)cm²/sec. By comparing the activation energy values for diffusion of various atomic species in silicon, it has been found empirically that enthalpy of migration is proportional to square of radius of solute atom.
 
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Language
英語  
Type of resource
text  
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Departmental Bulletin Paper  
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Last modified date
Aug 27, 2019 12:41:23  
Creation date
Dec 09, 2014 15:52:48  
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History
May 17, 2016    
May 18, 2016    インデックス, 著者 を変更
May 18, 2016    インデックス を変更
Aug 27, 2019    著者,著者 ローマ字,出版者 カナ,上位タイトル 名前,ISSN を変更
Aug 27, 2019    著者 ローマ字 を変更
 
Index
/ Public / Faculty of Science and Technology / Keio Science and Technology Reports / 19(1966) / 19(74) 1966
 
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